Electric

ARC 256x arc flash initiator

For testing such systems, the ARC 256x Arc Flash Initiator simulates an arc by a xenon tube, very similar to a camera flash. This CMC accessory is positioned close to the arc flash sensor during testing. Via its 6 m (19.7 ft) long connection cable it is connected to the external interface socket of the CMC test set, which provides both the supply voltage as well as the signal that will trigger the flash.

BNO1

This add-on relay converts the V OUT voltage output to a solid-state relay output for up to 10 A AC/DC (2 A continuous). For example, it can be used to trip a circuit breaker and measure the timing or to test logic functions.

Bushing adapters

• Suitable for use with measurement taps on Micafil, ABB, F&G, and HSP bushings as well as IEEE standard measurement taps
• Reliable connections of bushing tap sensors for fast setup
• Integrated surge arrester

C-Shunt precision shunts

C-Shunt 1 and C-Shunt 10 are precision shunts for current measurements. They can be directly inserted into the binary/analog inputs of OMICRON test sets such as CMCs or COMPANO 100.

CAL 542

• Lightweight and easy to use
• Intuitive setup of amplitudes
• IEC 60270 standard compliant
• Independent power supply with built-in battery

CB TN3

• Circuit breaker motion analysis
• Interference-free transmission of measurement results to CIBANO 500 via digital connection
• Can be connected to most standard linear and rotary motion sensors
• Easy and fast measurement of linear motion with magnetic tape concept

CBF1

Some self-powered relays are causing heavy interferences on the current path due to their integrated switch-mode power supply. CBF1 reduces this effect when testing such relays with COMPANO 100. It allows to test self-powered relays with currents up to 10 A.

CMGPS 588

The CMGPS 588 can be used to synchronize the time base of an OMICRON test set:

• Control one OMICRON test set at a predetermined point in time (triggering the starting point of a test process) or
• Synchronize the starting point of a test process of two or more OMICRON test sets or
• Accurately time-stamp data captured by an OMICRON test set

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